A numerical study of forming voltage and switching polarity dependence on Ti top electrode thickness in Zr $$\mathrm{O}_2$$ O 2 RRAM
Crossref DOI link: https://doi.org/10.1007/s10825-015-0783-0
Published Online: 2015-12-29
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Berco, Dan
Tseng, Tseung-Yuen
Funding for this research was provided by:
National Science Council Taiwan (TW) (NSC 102-2221-E-009-134-MY3)
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