Microscopic noise simulation of long- and short-channel nMOSFETs by a deterministic approach
Crossref DOI link: https://doi.org/10.1007/s10825-016-0840-3
Published Online: 2016-06-09
Published Print: 2016-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ruić, Dino
Jungemann, Christoph
Funding for this research was provided by:
Deutsche Forschungsgemeinschaft (JU406/9-1)
License valid from 2016-06-09