A systematic method for simulating total ionizing dose effects using the finite elements method
Crossref DOI link: https://doi.org/10.1007/s10825-017-1027-2
Published Online: 2017-07-08
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chatzikyriakou, Eleni https://orcid.org/0000-0002-5624-3701
Potter, Kenneth
de Groot, C. H.
Funding for this research was provided by:
EPSRC (1304067)
License valid from 2017-07-08