Crossmark

Filament-to-dielectric band alignments in $$\hbox {TiO}_{2}$$ TiO 2 and $$\hbox {HfO}_{2}$$ HfO 2 resistive RAMs

Crossref DOI link: https://doi.org/10.1007/s10825-017-1060-1

Published Online: 2017-09-06

Published Print: 2017-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Wu, Ze-Han

Xue, Kan-Hao https://orcid.org/0000-0002-2894-7912
Miao, Xiang-Shui
Funding

Funding for this research was provided by:

Ministry of Science and Technology of the People’s Republic of China (2016YFA0203800, 2017YFB0701701)

Natural Science Foundation of Hubei Province (2016CFB223)
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License valid from 2017-09-06