Reliable high-yield CNTFET-based 9T SRAM operating near threshold voltage region
Crossref DOI link: https://doi.org/10.1007/s10825-017-1127-z
Published Online: 2018-02-02
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Patel, Pramod Kumar http://orcid.org/0000-0002-4743-408X
Malik, M. M.
Gupta, Tarun K.
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First Online: 2 February 2018