An improved model to assess temperature-dependent DC characteristics of submicron GaN HEMTs
Crossref DOI link: https://doi.org/10.1007/s10825-018-1156-2
Published Online: 2018-03-26
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Khan, M. N.
Ahmed, U. F.
Ahmed, M. M.
Rehman, S.
Text and Data Mining valid from 2018-03-26
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First Online: 26 March 2018