High electric field stress model of n-channel VDMOSFET based on artificial neural network
Crossref DOI link: https://doi.org/10.1007/s10825-018-1167-z
Published Online: 2018-04-10
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Aleksić, Sanja http://orcid.org/0000-0003-2696-3879
Pantić, Aleksandar
Pantić, Dragan
Text and Data Mining valid from 2018-04-10
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First Online: 10 April 2018