Tang, Zhaohuan http://orcid.org/0000-0003-4116-3335
Li, Xingji
Tan, Kaizhou
Liu, Chaoming
Fu, Xinghua
Funding for this research was provided by:
Ministry of Education Open Foundation for Semiconductor Power Device Reliability of China (010201)
National Defense Science and Technology Key Lab Open Foundation for Space Materials Behavior and Evaluation of China (61429100306)
Article History
First Online: 11 August 2018