Strain effects on the DC performance of single-layer TMD-based double-gate field-effect transistors
Crossref DOI link: https://doi.org/10.1007/s10825-018-1227-4
Published Online: 2018-08-09
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hosseini, Manouchehr http://orcid.org/0000-0002-2837-6427
Karami, Hamidreza
Text and Data Mining valid from 2018-08-09
Article History
First Online: 9 August 2018