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A physics-based 3-D potential and threshold voltage model for undoped triple-gate FinFET with interface trapped charges

Crossref DOI link: https://doi.org/10.1007/s10825-018-1260-3

Published Online: 2018-10-24

Published Print: 2019-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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