An accurate compact model to extract the important physical parameters of an experimental nanoscale short-channel SOI MOSFET
Crossref DOI link: https://doi.org/10.1007/s10825-018-1267-9
Published Online: 2018-10-30
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Anvarifard, Mohammad K.
Text and Data Mining valid from 2018-10-30
Article History
First Online: 30 October 2018