An analytical modeling approach to the electrical behavior of the bottom-contact organic thin-film transistors in presence of the trap states
Crossref DOI link: https://doi.org/10.1007/s10825-019-01314-6
Published Online: 2019-02-19
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ana, Farkhanda http://orcid.org/0000-0002-8158-4380
Najeeb-ud-Din,
Text and Data Mining valid from 2019-02-19
Article History
First Online: 19 February 2019