Crossmark

Statistical analysis of the impact of charge traps in p-type MOSFETs via particle-based Monte Carlo device simulations

Published Online: 2020-03-06

Published Print: 2020-06

Authors

Rossetto, Alan C. J. https://orcid.org/0000-0003-1215-3197
Camargo, Vinicius V. A.

Both, Thiago H.

Vasileska, Dragica

Wirth, Gilson I.
Funding

Funding for this research was provided by:

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (Finance Code 001)
License Information

Text and Data Mining valid from 2020-03-06

Version of Record valid from 2020-03-06
More Information

Article History

First Online: 6 March 2020

Document is current