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The effects of carbon on the bidirectional threshold voltage instabilities induced by negative gate bias stress in GaN MIS-HEMTs

Crossref DOI link: https://doi.org/10.1007/s10825-020-01573-8

Published Online: 2020-08-24

Published Print: 2020-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Zagni, Nicolò https://orcid.org/0000-0003-2454-1883
Chini, Alessandro https://orcid.org/0000-0002-5865-271X
Puglisi, Francesco Maria https://orcid.org/0000-0001-6178-2614
Pavan, Paolo https://orcid.org/0000-0001-5420-1797
Verzellesi, Giovanni https://orcid.org/0000-0001-5770-6512
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Text and Data Mining valid from 2020-08-24

Version of Record valid from 2020-08-24
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Article History

Received: 7 May 2020

Accepted: 8 August 2020

First Online: 24 August 2020