BSIM3 model parameter extraction and performance analysis of a strained p-MOSFET for digital applications
Crossref DOI link: https://doi.org/10.1007/s10825-020-01584-5
Published Online: 2020-09-19
Published Print: 2021-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ranjbar Maleki, Soheil
Shalchian, Majid https://orcid.org/0000-0001-9741-0804
Khatami, Mohammad Mahdi
Text and Data Mining valid from 2020-09-19
Version of Record valid from 2020-09-19
Article History
Received: 14 May 2020
Accepted: 3 September 2020
First Online: 19 September 2020