Impacts of core gate thickness and Ge content variation on the performance of Si1−xGex source/drain Si–nanotube JLFET
Crossref DOI link: https://doi.org/10.1007/s10825-020-01618-y
Published Online: 2021-01-02
Published Print: 2021-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Thakur, Anchal http://orcid.org/0000-0001-7832-0221
Dhiman, Rohit
Text and Data Mining valid from 2021-01-02
Version of Record valid from 2021-01-02
Article History
Received: 29 April 2020
Accepted: 30 October 2020
First Online: 2 January 2021