Immunity to random fluctuations induced by interface trap variability in Si gate-all-around n-nanowire field-effect transistor devices
Crossref DOI link: https://doi.org/10.1007/s10825-021-01692-w
Published Online: 2021-04-03
Published Print: 2021-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sudarsanan, Akhil http://orcid.org/0000-0001-9617-7799
Nayak, Kaushik
Text and Data Mining valid from 2021-04-03
Version of Record valid from 2021-04-03
Article History
Received: 19 June 2020
Accepted: 12 March 2021
First Online: 3 April 2021