Temperature sensitivity analysis of dual material stack gate oxide source dielectric pocket TFET
Crossref DOI link: https://doi.org/10.1007/s10825-022-01902-z
Published Online: 2022-06-09
Published Print: 2022-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nigam, Kaushal
Kumar, Satyendra
Dharmender, http://orcid.org/0000-0001-6021-2281
Text and Data Mining valid from 2022-06-09
Version of Record valid from 2022-06-09
Article History
Received: 2 November 2021
Accepted: 25 April 2022
First Online: 9 June 2022
Declarations
:
: No conflicts of interest.
: The manuscript follows all the ethical standards, including plagiarism.
: Yes.