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Investigation of electronic structure, optical properties, map of electrostatic potential, and toxicity of HfO2, Hf0.88Si0.12O2, Hf0.88Ge0.12O2 and Hf0.88Sn0.12O2 by computational and virtual screening

Crossref DOI link: https://doi.org/10.1007/s10825-022-01964-z

Published Online: 2022-11-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Chakma, Unesco

Kumer, Ajoy https://orcid.org/0000-0001-5136-6166
Al Mashud, Md. Abdullah

Hossain, Md. Sayed

Alam, Md. Monsur

Islam, Md. Shariful

Shaikh, Rubel

Jony, Ismat Jahan

Islam, Jahedul
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Text and Data Mining valid from 2022-11-07

Version of Record valid from 2022-11-07
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Article History

Received: 14 January 2022

Accepted: 6 October 2022

First Online: 7 November 2022

Declarations

:

: The authors have not disclosed any conflict of interest.

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