Analytical modeling of a dual-material graded-channel cylindrical gate-all-around FET to minimize the short-channel effects
Crossref DOI link: https://doi.org/10.1007/s10825-022-01992-9
Published Online: 2022-12-20
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mudidhe, Praveen Kumar
Nistala, Bheema Rao
Text and Data Mining valid from 2022-12-20
Version of Record valid from 2022-12-20
Article History
Received: 3 March 2022
Accepted: 28 November 2022
First Online: 20 December 2022