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Machine learning-based prediction of the impact of random grain boundary Z-interference on Vt distribution in 3-D NAND flash memory

Crossref DOI link: https://doi.org/10.1007/s10825-025-02459-3

Published Online: 2025-11-25

Published Print: 2026-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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