Digital and analog/RF performance of stacked nanosheet transistors with various source/drain contact and bottom isolation designs
Crossref DOI link: https://doi.org/10.1007/s10825-025-02484-2
Published Online: 2026-01-10
Published Print: 2026-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Saleh, Mohamed
Bayoumi, Amr M.
Abdelhamid, Hamdy
Text and Data Mining valid from 2026-01-10
Version of Record valid from 2026-01-10
Article History
Received: 20 April 2025
Accepted: 19 December 2025
First Online: 10 January 2026
Declarations
:
: The authors declare no conflict of interest.