Crossmark

A simulation approach for improvement of contact resistance in organic field-effect transistors by modification of the contact interface using an organic buffer layer

Crossref DOI link: https://doi.org/10.1007/s10825-026-02499-3

Published Online: 2026-01-17

Published Print: 2026-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Kumar, Vijay https://orcid.org/0000-0001-9713-9647
Madhu, Charu https://orcid.org/0000-0002-3301-9897
License Information

Text and Data Mining valid from 2026-01-17

Version of Record valid from 2026-01-17
More Information

Article History

Received: 7 September 2025

Accepted: 6 January 2026

First Online: 17 January 2026

Declarations

:

: The authors declare no competing interests.

: No ethical clearance required.

Document is current

Any future updates will be listed below