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The shift to data-driven microelectronics: machine learning for MOSFET modeling, design, and reliability

Published Online: 2026-05-09

Published Print: 2026-06

Authors

Zhang, Qianhao

Guo, Junjie

Jiang, Chaoqun

Yao, Jingyu

Tao, Zhikuo
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Text and Data Mining valid from 2026-05-09

Version of Record valid from 2026-05-09
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Article History

Received: 10 March 2026

Accepted: 28 April 2026

First Online: 9 May 2026

Declarations

:

: The authors declare no competing interests.

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