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The effect of ITO and Mo electrodes on the properties and stability of In-Ga-Zn-O thin film transistors

Crossref DOI link: https://doi.org/10.1007/s10832-016-0022-5

Published Online: 2016-04-02

Published Print: 2016-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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