A study on the competition between bias-induced charge trapping and light-induced instability in In-Ga-Zn-O thin-film transistors
Crossref DOI link: https://doi.org/10.1007/s10832-016-0032-3
Published Online: 2016-04-08
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Park, Jozeph
Trung, Nguyen Dinh
Kim, Yang Soo
Kim, Jong Heon
Park, Kyung
Kim, Hyun-Suk
Funding for this research was provided by:
National Research Foundation of Korea (2014R1A1A2055138)
Chungnam National University
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