Crossmark

Back-to-Basics tutorial: X-ray diffraction of thin films

Published Online: 2021-10-13

Published Print: 2021-12

Authors

Harrington, George F. https://orcid.org/0000-0001-5641-3304
Santiso, José
Funding

Funding for this research was provided by:

Japan Science and Technology Agency (JPMJCE1318)

Generalitat de Catalunya (CERCA Programme)

Ministerio de Ciencia Tecnología y Telecomunicaciones (SEV-2017-0706)
License Information

Text and Data Mining valid from 2021-10-13

Version of Record valid from 2021-10-13
More Information

Article History

Received: 30 April 2021

Accepted: 5 August 2021

First Online: 13 October 2021

Document is current