Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test
Crossref DOI link: https://doi.org/10.1007/s10836-014-5457-5
Published Online: 2014-05-27
Published Print: 2014-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
de Carvalho, M.
Bernardi, P.
Sanchez, E.
Reorda, M. Sonza
Ballan, O.
Text and Data Mining valid from 2014-05-27