An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation Extraction
Crossref DOI link: https://doi.org/10.1007/s10836-014-5464-6
Published Online: 2014-08-19
Published Print: 2014-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tahanout, Cherifa
Tahi, Hakim
Djezzar, Boualem
Benabdelmomene, Abdelmadjid
Goudjil, Mohamed
Nadji, Becharia
Text and Data Mining valid from 2014-08-01