Testing Disturbance Faults in Various NAND Flash Memories
Crossref DOI link: https://doi.org/10.1007/s10836-014-5487-z
Published Online: 2014-11-01
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hou, Chih-Sheng
Li, Jin-Fu
Text and Data Mining valid from 2014-11-01