Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate Transformation
Crossref DOI link: https://doi.org/10.1007/s10836-014-5488-y
Published Online: 2014-11-05
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hsieh, Tong-Yu
Peng, Yi-Han
Li, Kuan-Hsien
Text and Data Mining valid from 2014-11-05
