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On-Wafer Calibration Technique for High Frequency Measurement with Simultaneous Voltage and Current Tuning

Crossref DOI link: https://doi.org/10.1007/s10836-014-5496-y

Published Online: 2014-11-28

Published Print: 2015-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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