Pseudo Functional Path Delay Test through Embedded Memories
Crossref DOI link: https://doi.org/10.1007/s10836-014-5497-x
Published Online: 2014-12-18
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gao, Yukun
Zhang, Tengteng
Pokharel, Punj
Chakraborty, Swati
Walker, D. M. H.
Text and Data Mining valid from 2014-12-18