One More Class of Sequential Circuits having Combinational Test Generation Complexity
Crossref DOI link: https://doi.org/10.1007/s10836-015-5527-3
Published Online: 2015-06-11
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Das, Debesh Kumar
Fujiwara, Hideo
Text and Data Mining valid from 2015-06-01