Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range
Crossref DOI link: https://doi.org/10.1007/s10836-015-5548-y
Published Online: 2015-11-13
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
David-Grignot, Stéphane
Azaïs, Florence
Latorre, Laurent
Lefevre, François
Text and Data Mining valid from 2015-11-13