Impact of Fin-Height on SRAM Soft Error Sensitivity and Cell Stability
Crossref DOI link: https://doi.org/10.1007/s10836-016-5591-3
Published Online: 2016-05-10
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Villacorta, Hector
Segura, Jaume
Champac, Victor
Funding for this research was provided by:
Consejo Nacional de Ciencia y TecnologĂa (212460)
Ministerio de EconomĂa y Competitividad (TEC2011-25017)
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