Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing
Crossref DOI link: https://doi.org/10.1007/s10836-016-5614-0
Published Online: 2016-09-14
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shintani, Michihiro
Uezono, Takumi
Hatayama, Kazumi
Masu, Kazuya
Sato, Takashi
Funding for this research was provided by:
Japan Society for the Promotion of Science (JP) (15K15960)
License valid from 2016-09-14