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Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances

Crossref DOI link: https://doi.org/10.1007/s10836-016-5620-2

Published Online: 2016-11-08

Published Print: 2016-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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