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Fast and Automated Electromigration Analysis for CMOS RF PA Design

Crossref DOI link: https://doi.org/10.1007/s10836-016-5639-4

Published Online: 2017-01-29

Published Print: 2017-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Gu, Junjie

Fu, Haipeng https://orcid.org/0000-0002-9809-1830
Na, Weicong

Zhang, Qijun

Ma, Jianguo
Funding

Funding for this research was provided by:

863 Program of China (2015AA01A703)

National Natural Science Foundation of China (61504092)

Tianjin Research Program of Application Foundation and Advanced Technology (15JCQNJC01200)
License Information

License valid from 2017-01-29