A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits
Crossref DOI link: https://doi.org/10.1007/s10836-017-5640-6
Published Online: 2017-01-11
Published Print: 2017-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wali, I.
Deveautour, B.
Virazel, Arnaud
Bosio, A.
Girard, P.
Sonza Reorda, M.
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