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Detectability Challenges of Bridge Defects in FinFET Based Logic Cells

Crossref DOI link: https://doi.org/10.1007/s10836-018-5714-0

Published Online: 2018-02-23

Published Print: 2018-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Forero, Freddy https://orcid.org/0000-0001-9939-0974
Galliere, Jean-Marc

Renovell, Michel

Champac, Victor
License Information

Text and Data Mining valid from 2018-02-23
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Article History

Received: 28 October 2017

Accepted: 8 February 2018

First Online: 23 February 2018