Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning
Crossref DOI link: https://doi.org/10.1007/s10836-018-5724-y
Published Online: 2018-04-12
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kansara, Parth
Reddy, Sharanabasavaraja Bheema
Abdallah, Louay
Huang, Ke http://orcid.org/0000-0002-1587-9877
Text and Data Mining valid from 2018-04-12
Article History
Received: 15 November 2017
Accepted: 28 March 2018
First Online: 12 April 2018