A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters
Crossref DOI link: https://doi.org/10.1007/s10836-018-5730-0
Published Online: 2018-05-03
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bounceur, Ahcène http://orcid.org/0000-0002-0043-7742
Djemai, Samia
Brahmi, Belkacem
Bibi, Mohand Ouamer
Euler, Reinhardt
Text and Data Mining valid from 2018-05-03
Article History
Received: 16 November 2017
Accepted: 16 April 2018
First Online: 3 May 2018