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Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories

Crossref DOI link: https://doi.org/10.1007/s10836-018-5752-7

Published Online: 2018-09-14

Published Print: 2018-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Lu, Shyue-Kung https://orcid.org/0000-0001-9232-2012
Zhong, Shang-Xiu

Hashizume, Masaki
License Information

Text and Data Mining valid from 2018-09-14
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Article History

Received: 9 April 2018

Accepted: 3 September 2018

First Online: 14 September 2018