Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits
Crossref DOI link: https://doi.org/10.1007/s10836-019-05791-2
Published Online: 2019-04-12
Published Print: 2019-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cai, Shuo
Wang, Weizheng
Yu, Fei
He, Binyong
Text and Data Mining valid from 2019-04-01
Article History
Received: 31 October 2018
Accepted: 12 March 2019
First Online: 12 April 2019