A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip
Crossref DOI link: https://doi.org/10.1007/s10836-019-05792-1
Published Online: 2019-05-02
Published Print: 2019-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bhowmik, Biswajit https://orcid.org/0000-0001-7923-9767
Biswas, Santosh
Deka, Jatindra Kumar
Bhattacharya, Bhargab B.
Text and Data Mining valid from 2019-04-01
Article History
Received: 1 December 2018
Accepted: 14 March 2019
First Online: 2 May 2019