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Test Generation for Bridging Faults in Reversible Circuits Using Path-Level Expressions

Crossref DOI link: https://doi.org/10.1007/s10836-019-05811-1

Published Online: 2019-06-22

Published Print: 2019-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Handique, Mousum

Biswas, Santosh http://orcid.org/0000-0003-3020-4154
Deka, Jantindra Kumar
License Information

Text and Data Mining valid from 2019-06-22

Version of Record valid from 2019-06-22
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Article History

Received: 31 October 2018

Accepted: 10 June 2019

First Online: 22 June 2019