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An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic

Crossref DOI link: https://doi.org/10.1007/s10836-020-05880-7

Published Online: 2020-06-06

Published Print: 2020-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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