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Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects

Published Online: 2021-06-01

Published Print: 2021-06

Authors

Copetti, Thiago https://orcid.org/0000-0001-7591-6484
Cardoso Medeiros, Guilherme

Taouil, Mottaqiallah

Hamdioui, Said

Bolzani Poehls, Letícia

Balen, Tiago
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Text and Data Mining valid from 2021-06-01

Version of Record valid from 2021-06-01
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Article History

Received: 15 December 2020

Accepted: 19 May 2021

First Online: 1 June 2021

Document is current