Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell
Crossref DOI link: https://doi.org/10.1007/s10836-021-05955-z
Published Online: 2021-08-18
Published Print: 2021-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Champac, Victor http://orcid.org/0000-0002-4440-3800
Mesalles, Javier
Villacorta, Hector
Vargas, Fabian
Text and Data Mining valid from 2021-06-01
Version of Record valid from 2021-06-01
Article History
Received: 19 November 2020
Accepted: 3 June 2021
First Online: 18 August 2021